Fail memory equipment in memory tester

Details Fail memory equipment in memory tester Fail memory equipment in memory tester

1985-04-03

1988-03-22

Shaw, Gareth D.

Excavating

364900, G01R 3128, G06F 1100

Patent

active

047333928

ABSTRACT:
A fail memory equipment has a plurality of memory blocks which can be changed in their combinations serially or in parallel in accordance with the capacity of a memory to be tested, the number of channels to be tested simultaneously and the testing speed. The single fail memory equipment operates in an interleave fetching mode for a high speed test, in a parallel fetching mode for a multi-channel test or in a serial fetching mode for testing a memory of a large capacity, thereby realizing a high speed test, a large capacity memory test and a simultaneous multi-channel test.

REFERENCES:
patent: 4369511 (1983-01-01), Kimura et al.
patent: 4414665 (1983-11-01), Kimura et al.
patent: 4541090 (1985-09-01), Shiragasawa
patent: 4628509 (1986-12-01), Kawaguchi

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