Magnetic thickness gauge with third support

Details Magnetic thickness gauge with third support Magnetic thickness gauge with third support

1985-10-01

1988-03-22

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

G01B 710

Patent

active

047331780

ABSTRACT:
A magnetic thickness gauge is disclosed wherein a balance arm is pivotally mounted in a housing with a spring providing a bias force to counteract a magnetic attraction of the balance arm toward a base of a coating to be measured. The balance arm is provided with a probe assembly including a magnet selectively positionable with respect to a spherical contact member of either a particular alloy of aluminum, iron and silicon or of tungsten carbide. The housing is preferably provided with supports at either end of the gauge. A balance arm is moved by way of a protrusion provided between the probe assembly and an adjustment knob for the spring with a scale and pointer indicating the thickness of the coating to be measured.

REFERENCES:
patent: 3521160 (1970-07-01), Nix et al.
patent: 4125807 (1978-11-01), Steingroever
patent: 4152646 (1979-05-01), Steingroever et al.
patent: 4164707 (1979-08-01), Nix
patent: 4403188 (1983-09-01), Nix
Nix et al, "Mikrotest.RTM.", pp. 1-6, sales brochure of magnetic thickness gauge.

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