Method of testing electrical characteristics of LCD with probe d

Details Method of testing electrical characteristics of LCD with probe d Method of testing electrical characteristics of LCD with probe d

1988-09-02

1990-02-06

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 713, 324158R, 324158D, G01R 3126

Patent

active

048991058

ABSTRACT:
A method of testing electrical characteristics with a probe device, wherein an object to be tested is placed on a table of the probe device, and the electrical characteristics of the object are measured while light is supplied from a light source unit outside the test unit to the test unit for the object through a light supplying means unit. A light source need not be arranged inside the test unit, thereby preventing the temperature atmosphere inside the test unit from being disturbed, and the electrical characteristics of the object can be tested under severe conditions with radiation of external light.

REFERENCES:
patent: 4309657 (1982-01-01), Lockhart, Jr. et al.
patent: 4393348 (1983-07-01), Goldstein et al.
patent: 4656419 (1987-04-01), Garlick
patent: 4712063 (1987-12-01), Osterwald et al.
patent: 4715687 (1987-12-01), Glass et al.
patent: 4728174 (1988-03-01), Grinberg et al.

Affiliated with

Also associated with

Rating

Method of testing electrical characteristics of LCD with probe d does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of testing electrical characteristics of LCD with probe d, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of testing electrical characteristics of LCD with probe d will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-443658