Multi-functional measurement system

Details Multi-functional measurement system Multi-functional measurement system

1990-04-20

1994-03-22

Beausoliel, Jr., Robert W.

Boots, shoes, and leggings

G05B 1919

Patent

active

052970558

ABSTRACT:
A multi-purpose probe module 82, comprising both a touch-trigger type contact probe 84 and a non-contact type probe 86, is used in method and apparatus for monitoring and adjusting the accuracy of a computer-controlled machine for manufacturing precision bevel and hypoid gears. The probe module is mounted on the machine's tool support and is used in conjunction with locating points positioned on the machine's work support to monitor and recalibrate the relative positions of the tool and work supports. The probe module is also used to monitor the flanks of the gear-shaped workpieces (a) for initial stock division, (b) for pre-machining accuracy, (c) for first-piece testing, (d) for in-process accuracy, and (e) for post-machining accuracy. The same probe module is used in combination with a sacrificial test wafer mounted on the work support for adjusting the position of the machine's cup-shaped grinding wheel following each dressing of the latter's working surfaces.

REFERENCES:
patent: 3522524 (1970-08-01), Smith et al.
patent: 3942254 (1976-03-01), Thompson et al.
patent: 4001556 (1977-01-01), Folchi et al.
patent: 4166323 (1979-09-01), Maag
patent: 4181958 (1980-01-01), Juengel et al.
patent: 4382215 (1983-05-01), Barlow et al.
patent: 4437151 (1984-03-01), Hurt et al.
patent: 4631870 (1986-12-01), Sun
patent: 4704799 (1987-11-01), Kobetsky
patent: 4755950 (1988-07-01), Rao
patent: 4778313 (1988-10-01), Lehmkuhl
patent: 4779319 (1988-10-01), Juengel
patent: 4796195 (1989-01-01), Haggerty
patent: 4816729 (1989-03-01), Carlson
patent: 4866643 (1989-09-01), Dutler
patent: 4901256 (1990-02-01), McMurtry et al.
patent: 4908951 (1990-03-01), Gurny
patent: 4974165 (1990-11-01), Locke et al.

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