Sliding contact test apparatus

Details Sliding contact test apparatus Sliding contact test apparatus

1989-09-21

1991-07-23

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 209573, G01R 1512

Patent

active

050347497

ABSTRACT:
The apparatus (20) includes electrically conductive contacts (44, 54) that are spaced apart a distance slightly less than the distance between the terminals (34, 36) formed on the components (24) to be tested. One contact (54) is held in position by a spring (112). The other contact (44) is stationary. The contacts (44, 54) slide against the terminal surfaces (52, 56) of the components (24) that are conveyed into a test location (26) between the contacts. The apparatus employs few moving parts and the sliding motion of the contacts (44, 54) against the terminal surfaces (52, 56) ensures that the contacts (44, 54) penetrate any oxide layer present on the terminal surfaces (52, 56). In an alternative embodiment (160), two sets of contacts (44L, 44T, 54L, 54T) are employed for testing components (24) in two adjacent test locations (26L, 26T). One configuration of a movable contact (304) is such that minimal force is applied to the terminal surfaces (52, 56) of the components (24) so that the components may be tested without marking or damaging the surfaces (52, 56).

REFERENCES:
patent: 3239059 (1966-03-01), Cole, Jr. et al.
patent: 4747479 (1988-05-01), Herrman
patent: 4790438 (1988-12-01), Wichelm et al.
patent: 4818382 (1987-04-01), Anderson et al.
Frisbie, Pass through Test Socket for Semiconductor Devices, 2/86, PCT WO86/01133.

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