Test apparatus that tests a device under test having a test...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S073100

Reexamination Certificate

active

08072232

ABSTRACT:
Provided is a test apparatus that tests a device under test having a test function for sequentially outputting, from a single test terminal, signals that would be output from a plurality of terminals, the test apparatus comprising: a test section that supplies the device under test with a test signal and receives signals that are sequentially output from the test terminal in response to the test signal; an identifying section that identifies a correspondence between each signal sequentially received by the test section and a signal that would be output from one of the terminals of the device under test; and a counting section that counts a number of signals judged to be unacceptable from among the signals sequentially received by the test section for each terminal of the device under test, based on the correspondence identified by the identifying section.

REFERENCES:
patent: 5914964 (1999-06-01), Saito et al.
patent: 6301182 (2001-10-01), Tanaka
patent: 6317851 (2001-11-01), Kobayashi
patent: 6377065 (2002-04-01), Le et al.
patent: 6404220 (2002-06-01), Hashimoto
patent: 2002/0036513 (2002-03-01), Hashimoto
patent: 2335280 (1999-09-01), None
patent: 01-308978 (1989-12-01), None
patent: 03-028596 (1991-03-01), None
patent: 06-028892 (1994-02-01), None
patent: 9-33615 (1997-02-01), None
patent: 11-223660 (1999-08-01), None
patent: 2001-043700 (2001-02-01), None
patent: 3237579 (2001-12-01), None
patent: 0363936 (2002-12-01), None
International Search Report (ISR) issued in PCT/JP2007/059877 (parent application) for Examiner consideration, citing U.S. Patent Nos. 1-2 and Foreign Patent Document Nos. 1-6 listed above.
Written Option (PCT/ISA/237) issued in PCT/JP2007/059877 (parent application).
Korean Office Action dated Apr. 26, 2011, in counterpart application KR 10-2009-7025770.

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