Thin organic alignment layers with a batch process for...

Coating processes – Coating by vapor – gas – or smoke

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C427S058000

Reexamination Certificate

active

08075953

ABSTRACT:
A method to form alignment layers on a substrate of an LCD is disclosed. The substrate is placed in a vacuum chamber and undergoes a purging process. The purging process heats the substrates and removes water vapor from the vacuum chamber. Specifically, the vacuum chamber is evacuated to a low pressure and refilled with a preheated inert gas. Evacuation of the vacuum chamber and refilling of the vacuum chamber is repeated several times. The alignment layer is then deposited using vapor deposition. Alternatively, plasma enhanced vapor deposition can be used for depositing the alignment layer. Furthermore, plasma cleaning prior to the deposition of the alignment layer can used clean the substrate.

REFERENCES:
patent: 5759643 (1998-06-01), Miyashita et al.
patent: 6339459 (2002-01-01), Ichikawa et al.
patent: 6352594 (2002-03-01), Cook et al.
patent: 6461437 (2002-10-01), Kubota et al.
patent: 6724449 (2004-04-01), Andry et al.
patent: 6830831 (2004-12-01), O'Neill et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thin organic alignment layers with a batch process for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thin organic alignment layers with a batch process for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin organic alignment layers with a batch process for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4314643

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.