Semiconductor device manufacturing: process – Chemical etching
Reexamination Certificate
2008-05-13
2011-12-13
Smith, Matthew (Department: 2892)
Semiconductor device manufacturing: process
Chemical etching
C438S717000, C438S734000, C257SE21217
Reexamination Certificate
active
08076245
ABSTRACT:
A metal oxide semiconductor (MOS) device includes a substrate, a lower sacrificial membrane adjacent to the substrate, an upper thin film structure adjacent to the lower membrane, and a MOS material deposited on the upper thin film structure.
REFERENCES:
patent: 2002/0102753 (2002-08-01), Johnson et al.
patent: 2005/0072924 (2005-04-01), Wood et al.
patent: 2006/0249384 (2006-11-01), Kim et al.
Cole Barrett E.
Higashi Robert E.
Honeywell International , Inc.
Schwegman Lundberg & Woessner, P.A.
Smith Matthew
Ullah Elias
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