Measuring apparatus, measuring method and test apparatus

Details Measuring apparatus, measuring method and test apparatus Measuring apparatus, measuring method and test apparatus

2009-01-21

2011-11-15

Le, John H (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S089000

Reexamination Certificate

active

08060326

ABSTRACT:
Provided is a measurement apparatus including a first timing detecting section that detects first change timings of a signal under measurement, a second timing detecting section that detects second change timings of the signal under measurement, a buffer section that buffers data indicating the first change timings detected by the first timing detecting section and data indicating the second change timings detected by the second timing detecting section, and a calculating section that acquires, from the buffer section, the data indicating the first change timings and the data indicating the second change timings, calculates a temporal relationship between the first change timings and the second change timings, and outputs the temporal relationship.

REFERENCES:
patent: 6622103 (2003-09-01), Miller
patent: 6-094853 (1994-04-01), None

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