Method and apparatus for positioning and contacting...

Details Method and apparatus for positioning and contacting... Method and apparatus for positioning and contacting...

2011-04-22

2011-10-25

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S750250, C324S762010

Reexamination Certificate

active

08044673

ABSTRACT:
A re-configurable test socket system and test socket architecture are described involving a combination of particular micro elements and re-useable macro elements that can be reused and reconfigured for testing a wide variety of different semiconductor and integrated circuit (IC) DUT packages having different shapes, sizes, and terminal configurations.

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