Registers – Records – Conductive
Reexamination Certificate
2008-11-21
2011-11-01
Labaze, Edwyn (Department: 2887)
Registers
Records
Conductive
C235S451000, C235S375000
Reexamination Certificate
active
08047442
ABSTRACT:
A semiconductor device in which damages to an element such as a transistor are reduced even when external force such as bending is applied and stress is generated in the semiconductor device. The semiconductor device includes a first island-like reinforcement film over a substrate having flexibility; a semiconductor film including a channel formation region and an impurity region over the first island-like reinforcement film; a first conductive film over the channel formation region with a gate insulating film interposed therebetween; a second island-like reinforcement film covering the first conductive film and the gate insulating film.
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Goto Yuugo
Murakawa Tsutomu
Yamazaki Shunpei
Costellia Jeffrey L.
Labaze Edwyn
Nixon & Peabody LLP
Semiconductor Energy Laboratory Co,. Ltd.
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