Process for examining mineral samples with X-ray microscope...

X-ray or gamma ray systems or devices – Specific application – Tomography

Reexamination Certificate

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C378S004000

Reexamination Certificate

active

08068579

ABSTRACT:
A process to determine the porosity and/or mineral content of mineral samples with an x-ray CT system is described. Based on the direct-projection techniques that use a spatially-resolved x-ray detector to record the x-ray radiation passing through the sample, 1 micrometer or better resolution is achievable. Furthermore, by using an x-ray objective lens to magnify the x-ray image in a microscope configuration, a higher resolution of up to 50 nanometers or more is achieved with state-of-the-art technology. These x-ray CT techniques directly obtain the 3D structure of the sample with no modifications to the sample being necessary. Furthermore, fluid or gas flow experiments can often be conducted during data acquisition so that one may perform live monitoring of the physical process in 3D.

REFERENCES:
patent: 5627874 (1997-05-01), Smallbone
patent: 6052431 (2000-04-01), Onoguchi et al.
patent: 6655192 (2003-12-01), Chavdar
patent: 7215736 (2007-05-01), Wang et al.
patent: 2008/0165924 (2008-07-01), Wang et al.

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