Dynamic random access memory having junction field effect...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor

Reexamination Certificate

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C257S272000, C257S392000, C257SE21631

Reexamination Certificate

active

08035139

ABSTRACT:
A dynamic random access memory (DRAM) device can include a plurality of memory cells. Each memory cell can include a charge storing structure and an access device comprising an enhancement mode junction field effect transistor (JFET). The DRAM device can further include a plurality of sense amplifiers that each generates an output value in response to a signal received at respective sense amplifier inputs, and a plurality of bit lines, each bit line coupling a plurality of memory cells to at least one input of at least one of the sense amplifiers. A method can fabricate such DRAM devices.

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