Semiconductor structure and method of manufacture

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having air-gap dielectric

Reexamination Certificate

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C438S421000, C438S411000, C438S433000, C438S434000, C257S506000, C257S510000, C257S522000, C257S634000, C257SE29020, C257SE21573, C257SE21581

Reexamination Certificate

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08048760

ABSTRACT:
In various embodiments, semiconductor structures and methods to manufacture these structures are disclosed. In one embodiment, a structure includes a dielectric material and a void below a surface of a substrate. The structure further includes a doped dielectric material over the dielectric material, over the first void, wherein at least a portion of the dielectric material is between at least a portion of the substrate and at least a portion of the doped dielectric material. Other embodiments are described and claimed.

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