X-ray interferometer for phase contrast imaging

X-ray or gamma ray systems or devices – Specific application – Holography or interferometry

Reexamination Certificate

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Reexamination Certificate

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08041004

ABSTRACT:
An interferometer for x-rays, in particular hard x-rays, for obtaining quantitative x-ray images from an object, includes: a) an x-ray source, preferably a standard polychromatic x-ray source, b) a diffractive beam splitter grating other than a Bragg crystal, preferably in transmission geometry, c) a position-sensitive detector with spatially modulated detection sensitivity having a number of individual pixels; d) means for recording the images of the detector in a phase-stepping approach; and e) means for evaluating the intensities for each pixel in a series of images in order to identify the characteristic of the object for each individual pixel as an absorption dominated pixel and/or an differential phase contrast dominated pixel and/or an x-ray scattering dominated pixel.

REFERENCES:
patent: 3944833 (1976-03-01), Hounsfield
patent: 2006/0039532 (2006-02-01), Wu et al.
patent: 2009/0092227 (2009-04-01), David et al.
patent: 1447046 (2004-08-01), None
patent: 1731099 (2006-12-01), None
Pfeiffer et al: “Phase Retrieval and Differential Phase-Contrast Imaging with Low-Brilliance X-Ray Sources”, XP002422783, Nature Physics, Nature Publishing Group, Mar. 26, 2006, pp. 258-261, London, GB.
Weitkamp et al: “X-Ray Phase Imaging with a Grating Interferometer”, XP002397629, Optics Express, Optical Society of America, Aug. 8, 2005, pp. 6296-6304, vol. 13, No. 16, Washington, DC.
Momose et al: “Phase Tomography by X-Ray Talbot Interferometry for Biological Imaging”, XP002444795, Japanese Journal of Applied Physics, Jun. 2006, pp. 5254-5262, vol. 45, No. 6A.

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