Probe card assembly with interposer probes

Details Probe card assembly with interposer probes Probe card assembly with interposer probes

2008-01-23

2011-11-15

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754030, C324S754110, C324S500000

Reexamination Certificate

active

08058887

ABSTRACT:
A probe test card assembly for testing a device under test includes interposer probes to connect a printed circuit board to a substrate. The probe test card assembly includes a printed circuit board, a substrate and a substrate holder. A plurality of test probes is connected to the substrate for making electrical contact with the device under test. A plurality of interposer probes is attached to the substrate for providing electrical connections between the substrate and the printed circuit board. The substrate holder holds the substrate in position with respect to the printed circuit board so that the interposer probes contact the printed circuit board. The interposer probes may be arranged in interposer probe groups to facilitate maintenance and replacement of the interposer probes. Hardstop elements may also be used to protect the interposer probes.

REFERENCES:
patent: 6482013 (2002-11-01), Eldridge et al.
patent: 7579856 (2009-08-01), Khandros et al.

Affiliated with

Also associated with

Rating

Probe card assembly with interposer probes does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe card assembly with interposer probes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe card assembly with interposer probes will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4283146