Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2010-07-21
2011-10-11
Dole, Timothy J (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S631000, C324S632000, C324S642000, C324S645000, C378S058000, C378S062000
Reexamination Certificate
active
08035400
ABSTRACT:
The enhanced detection of defects and features in bulk dielectric materials is disclosed. Microwave radiation partly reflected at interfaces where the dielectric constant changes (e.g., where there are defects or structures). A sinusoidal or quasi-sinusoidal wave results. Localization or imaging of features is enhanced by exploiting the variation in distance resolution in a sinusoidal or quasi-sinusoidal standing wave. At characteristic distances, the wave has a high slope, and the amplitude of the wave varies strongly with small changes in distance. By inspecting at these characteristic distances, the resolution is enhanced. By systematically varying the position of the transducer or specimen, detailed images may be formed of the internal structure of the specimen across a range of depths. Defects and structures may be detected at smaller sizes than has previously been possible. The resolution of the imaging may be substantially smaller than the wavelength of the interrogating radiation.
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Davis Bonnie J.
Dole Timothy J
Runnels John H.
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