Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate
2009-10-27
2011-11-01
Souw, Bernard E (Department: 2881)
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
C250S492230, C355S067000, C355S052000
Reexamination Certificate
active
08049191
ABSTRACT:
A method includes setting a target pattern to be formed on a substrate using a reticle, obtaining a first pattern using the reticle and a first illumination condition, calculating, a second illumination condition under which the target pattern is transferred onto the substrate using the reticle, and a third illumination condition under which the first pattern is transferred onto a substrate using the reticle, using mathematical models each of which defines the relationship between an illumination condition and a virtual pattern transferred onto a substrate using the illumination condition, determining a fourth illumination condition, obtained by adding the difference between the calculated second illumination condition and third illumination condition to the first illumination condition, as the illumination condition, and transferring the pattern of the reticle onto the substrate by illuminating the reticle using the determined illumination condition.
REFERENCES:
patent: 6774043 (2004-08-01), Yamaguchi et al.
patent: 7518704 (2009-04-01), Kim et al.
patent: 2002/0153496 (2002-10-01), Hirayanagi
patent: 2005/0259234 (2005-11-01), Hirukawa et al.
patent: 2006/0192933 (2006-08-01), Kim et al.
patent: 2007/0013896 (2007-01-01), Tsujita
patent: 2009/0310116 (2009-12-01), Tsujita et al.
patent: 2010/0290020 (2010-11-01), Mori
L.Van Look, et al, “Tool-to-tool optical proximity effect matching”, Proc. of SPIE, vol. 6924, 69241Q 1-12, (2008).
“Toward a Breakthrough of Real-coded Genetic Algorithms”, Proceedings of Symposium on Evolutionary Computation 2007, (Date: Dec. 27-28, 2007; Venue: Hokkaido Toya Lake), Society for Evolutionary Computation.
Ishii Hiroyuki
Mikami Koji
Tsujita Kouichirou
Canon Kabushiki Kaisha
Canon U.S.A. Inc. IP Division
Souw Bernard E
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