Aligning beams over successive reflections by facets of...

Details Aligning beams over successive reflections by facets of... Aligning beams over successive reflections by facets of...

2008-10-06

2011-10-11

Tran, Huan (Department: 2861)

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C347S250000

Reexamination Certificate

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08035675

ABSTRACT:
First delay mechanisms to delay a beam-detect signal by different lengths of time in synchronization with a first clock signal. The beam-detect signal is generated responsive to one or more beams being output towards a rotating polygonal mirror having facets and directed towards a sensor. One or more second delay mechanisms each correspond to one of the beams to delay a second clock signal, resulting in a beam-clock signal to align the beam over successive reflections by the facets. A mechanism determines a delay by which each second delay mechanism is to delay the second clock signal, based on the beam-detect signal as differently delayed by the first delay mechanisms.

REFERENCES:
patent: 6219085 (2001-04-01), Hanna
patent: 6493019 (2002-12-01), Hirasawa
patent: 7382385 (2008-06-01), Breen et al.
patent: 7719558 (2010-05-01), Unruh et al.
patent: 2002/0071165 (2002-06-01), Hamada
patent: 2004/0109210 (2004-06-01), Yoshida
patent: 2007/0286655 (2007-12-01), Wilson

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