Semiconductor device

Details Semiconductor device Semiconductor device

2009-01-30

2011-11-22

Smith, R. A. (Department: 2841)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C374S163000, C374S141000, C365S212000, C365S189090, C365S189110

Reexamination Certificate

active

08061895

ABSTRACT:
There is provided a semiconductor device which can maintain a high tuning accuracy while suppressing a cost increase and suppress an increase in the time required for tuning. There are included, in addition to variable resistors configuring a level shift circuit, an additional resistor coupled between the output node of a VBGR voltage of a BGR circuit and one of the variable resistors and an additional resistor coupled between the other of the variable resistors and a reference voltage. N-channel MOS transistors are coupled in parallel with the additional resistors, respectively.

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patent: 7710705 (2010-05-01), Balakrishnan et al.
patent: 2002/0012277 (2002-01-01), Einaga
patent: 1993-266658 (1993-10-01), None
patent: 2003258112 (2003-09-01), None

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