Method for processing sensor signals subject to an offset...

Electricity: measuring and testing – Magnetic – Displacement

Reexamination Certificate

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Reexamination Certificate

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08063629

ABSTRACT:
In a method and a sensor arrangement for processing sensor signals of a sensor, which is operated in a plurality of measurement cycles with successive phases with different driving, before the amplification, the sensor signals of n phases of each measurement cycle are weighted with negative mathematical sign and the sensor signals of the remaining n phases of the measurement cycle are weighted with positive mathematical sign by a modulation. Before the amplification, an offset averaged from the sensor signals of the two phases is subtracted from the sensor signals of each two of the phases which were weighted with different mathematical sign and have an offset of the same mathematical sign after the modulation. The artificially generated offset is eliminated again by a demodulation after the amplifier and a summation over the digitized signals of each measurement cycle.

REFERENCES:
patent: 6674322 (2004-01-01), Motz
patent: 1 637 898 (2004-09-01), None
A CMOS Nested-Chopper Instrumentation Amplifier with 100-nV Offset; Bakker et al., IEEE Journal of Solid-State Circuits, vol. 35, No. 12, Dec. 2000.

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