Television – Camera – system and detail – Optics
Reexamination Certificate
2004-12-28
2011-12-06
Aggarwal, Yogesh (Department: 2622)
Television
Camera, system and detail
Optics
C348S340000, C348S345000, C348S348000
Reexamination Certificate
active
08072529
ABSTRACT:
A solid-state imaging device includes a semiconductor substrate having a principal surface, and three or more pixel regions formed in at least one direction of two different directions along the principal surface of the semiconductor substrate. Each pixel region includes a plurality of photoelectric conversion regions having different sensitivities. The photoelectric conversion region having the highest sensitivity in peripheral pixel regions of the pixel regions has a higher sensitivity than the photoelectric conversion region having the highest sensitivity in a central pixel region of the pixel regions.
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Aggarwal Yogesh
Rader & Fishman & Grauer, PLLC
Sony Corporation
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