Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate
2007-08-02
2010-11-16
Smoot, Stephen W (Department: 2813)
Semiconductor device manufacturing: process
With measuring or testing
Optical characteristic sensed
C438S047000, C257SE21527
Reexamination Certificate
active
07833807
ABSTRACT:
Some semiconductor lasers have an initial failure mode that is advanced as the amount of optical power therein, namely, the amount of optical output observed from the outside increases in almost independent of the temperature. The initial failure mode that is advanced as the amount of optical output increases is not sufficiently screened, so that the initial failure rate is somewhat higher than that of the semiconductor laser having the conventional active layer material. It is effective to introduce a test with large optical output at lower temperature than average operating temperature such as room temperature, during the manufacturing process. This helps to eliminate elements having the initial failure mode that is advanced as the amount optical output increases, thereby to extend the expected life of the laser diodes.
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Inoue Hiroaki
Kamiyama Hiroyuki
Kitahara Chiyuki
Mukaikubo Masaru
McDermott Will & Emery LLP
Opnext Japan, Inc.
Smoot Stephen W
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