Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Bump leads
Reexamination Certificate
2007-09-14
2010-06-22
Pham, Thanh V (Department: 2894)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Bump leads
C257S688000, C257SE23021
Reexamination Certificate
active
07741712
ABSTRACT:
A semiconductor device in the first embodiment includes: an electrode pad and a resin projection, formed on an active surface; a conductive film deposited from a surface of the electrode pad to a surface of the resin projection; a resin bump formed with the resin projection and with the conductive film. The semiconductor device is conductively connected to the opposing substrate through the resin bump electrode. The testing electrode is formed with the conductive film that is extended and applied to the opposite side of the electrode pad across the resin projection.
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Translation of JP 11067776 A.
Aruga Yasuhito
Ito Haruki
Takano Michiyoshi
Tamura Ryohei
Tanaka Shuichi
Harness & Dickey & Pierce P.L.C.
Payen Marvin
Pham Thanh V
Seiko Epson Corporation
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