Semiconductor memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Magnetic field

Reexamination Certificate

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Details

C257S506000, C257S522000, C257SE21540, C257SE29323

Reexamination Certificate

active

07821086

ABSTRACT:
A semiconductor memory device includes a first write line which is provided in a first direction, a first memory element which is connected to the first write line, a second memory element which is provided to neighbor the first memory element in the first direction, and is connected to the first write line, a first insulation film which is provided on surfaces of the first and second memory elements, and a second insulation film which is provided between the neighboring first and second memory elements and has a lower heat conductivity than the first insulation film.

REFERENCES:
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patent: 2003/0003647 (2003-01-01), Dennison et al.
patent: 2005/0036361 (2005-02-01), Fukuzumi
patent: 2007/0096248 (2007-05-01), Philipp et al.
patent: 2007/0099377 (2007-05-01), Happ et al.
patent: 2007/0108430 (2007-05-01), Lung
patent: 2007/0109836 (2007-05-01), Lung
patent: 2007/0181932 (2007-08-01), Happ et al.
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patent: 2008/0099791 (2008-05-01), Lung
patent: 2008/0116442 (2008-05-01), Nirschl et al.
patent: 2003-298025 (2003-10-01), None
M. Motoyoshi, et al., “A study for 0.18um High-Density MRAM”, 2004 Symposium on VLSI Technology Digest of Technical Papers, IEEE, 2004, pp. 22-23.
H. Hosomi, et al., “A Novel Nonvolatile Memory with Spin Torque Transfer Magnetization Swithching: Spin-RAM”, IEDM Technical Digest, 473, IEEE, 2005, 4 pages.

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