System and method for time domain reflectometry testing

Details System and method for time domain reflectometry testing System and method for time domain reflectometry testing

2007-10-19

2010-11-30

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S117000

Reexamination Certificate

active

07844408

ABSTRACT:
A time domain reflectometry (“TDR”) testing method that includes storing test data resulted from a TDR test applied on an electronic component, displaying the test data, identifying a distinctive portion of the test data corresponding to a defective location in the electronic component, modifying the distinctive portion of the test data, and computing the modified test data to verify whether a predetermined requirement is satisfied.

REFERENCES:
patent: 6920407 (2005-07-01), Adamian et al.
patent: 7271575 (2007-09-01), Pickerd et al.
patent: 2004/0027138 (2004-02-01), Pickerd et al.
patent: 2005/0177328 (2005-08-01), Belforte et al.

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