Inspection method and apparatus for partially drilled microvias

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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C382S209000

Reexamination Certificate

active

07668364

ABSTRACT:
Inspection of partially drilled microvias by fluorescence based optical imaging techniques, selective coaxial illumination and multivariable off-axis illumination and the use of comparative image analysis and the transformation of back reflected radiation by means of an integrated fluorescing plate mounted to the surface of a CCD or EMCCD array.

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