Time-sloped capacitance measuring circuits and methods

Details Time-sloped capacitance measuring circuits and methods Time-sloped capacitance measuring circuits and methods

2008-02-07

2010-11-09

Nguyen, Hoai-An D (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S684000

Reexamination Certificate

active

07830158

ABSTRACT:
Time-sloped capacitance measuring circuits use the time to ramp voltage signals between reference levels to determine an unknown capacitance, where the ramping time is determined by the cumulative whole number of clock cycles counted during voltage signal ramping over multiple ramp cycles. Measurement resolution can be improved by adjusting a starting voltage level for subsequent voltage signal ramps by an amount that compensates for incremental voltage ramping during a terminal clock cycle of a previous voltage signal ramp.

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