Method and system to attach carbon nanotube probe to...

Electric heating – Metal heating – Cutting or disintegrating

Reexamination Certificate

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Details

C423S447100, C423S447300, C423S585000, C427S564000, C228S101000

Reexamination Certificate

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07847207

ABSTRACT:
An easy and controllable method and system to attach a carbon nanotube to a scanning probe tip such as a scanning probe microscopy (SPM) tip using a focus ion beam (FIB) technique. The method and system includes selecting a carbon fiber by a Focus Ion Beam micromanipulator, picking up the carbon fiber with the nanotube tip, forming a slot on an SPM tip, and inserting the carbon fiber with the nanotube tip into the slot.

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