Spectrosorptance measuring system and method

Optics: measuring and testing – For optical fiber or waveguide inspection

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356236, 250228, G01N 2100, G01J 104

Patent

active

040121445

ABSTRACT:
Apparatus and method for measuring the absolute absorptance of a relatively thin sample displaying both reflecting and transmitting characteristics. An integrating sphere is provided, and monochromatic reference and sample beams are projected into the sphere from a pair of angularly-spaced ports. Detector means are positioned at the sphere to receive illumination from the internal sphere wall, including the illumination arising from the first reflectance from that portion of the sphere directly illuminated by the sample and reference beams. The reference and sample electrical signals proceeding from the detector are equalized over the wavelength range of the instrument to establish a relatively flat baseline with the sample withdrawn from the sample beam. The sample is then repositioned within the sample beam. By virtue of the position of the detector and the thinness of the sample, the detector views the illumination of the sphere wall, but substantially excludes the first reflectance and scattered energy from the sample. The light falling on the detector due to illumination of the sphere via the sample is compared with the light falling on the detector due to illumination of the sphere by the reference beam, the ratio between the two providing a direct measure of the quantity of incident sample beam energy transmitted and reflected by said sample. By subtracting the thus determined reflectance and transmittance of the sample from unity, the absorptance of the sample may be directly indicated.

REFERENCES:
patent: 2707900 (1955-05-01), Maresh et al.
patent: 3242797 (1966-03-01), Sundstrom
patent: 3459480 (1969-08-01), Prescott et al.
patent: 3746869 (1973-07-01), Lindstedt et al.

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