Multi-modality inspection system

Details Multi-modality inspection system Multi-modality inspection system

2007-11-28

2010-11-23

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Position measurement

C702S094000, C702S150000, C702S152000, C250S559300, C600S425000

Reexamination Certificate

active

07840367

ABSTRACT:
An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.

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