Segmented end electrode capacitor and method of segmenting...

Semiconductor device manufacturing: process – Making passive device

Reexamination Certificate

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C438S239000, C257SE21008, C257SE21011, C257SE21014, C257SE21170, C257SE21020, C361S301100, C361S301200, C361S301400, C361S301500, C361S303000, C361S306100, C361S306300, C361S309000, C361S311000, C361S313000, C029S025420, C029S025350, C029S831000, C029S832000

Reexamination Certificate

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07655530

ABSTRACT:
An exemplary embodiment providing one or more improvements includes a capacitor with a segmented end electrode and methods for segmenting an end electrode of a capacitor for reducing or eliminating instances of thermally induced damage of the capacitor.

REFERENCES:
patent: 4889760 (1989-12-01), Kippenberg et al.
patent: 6477035 (2002-11-01), Cepas et al.
patent: 6523235 (2003-02-01), Ishigaki et al.
patent: 6829133 (2004-12-01), Wermer et al.
patent: 6912115 (2005-06-01), Kobayashi et al.

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