Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2009-05-19
2010-11-30
Stark, Jarrett J (Department: 2823)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C438S230000, C438S231000, C438S232000, C438S595000, C257SE21546, C257S374000
Reexamination Certificate
active
07842582
ABSTRACT:
A method of forming semiconductor devices includes providing a semiconductor substrate in which gate insulating patterns and first conductive patterns are formed, performing a first etch process to narrow a width of each of the first conductive patterns, forming an auxiliary layer on the first conductive patterns, the gate insulating patterns, and an exposed surface of the semiconductor substrate, and forming trenches by etching the auxiliary layer and the semiconductor substrate between the first conductive patterns.
REFERENCES:
patent: 6787409 (2004-09-01), Ji et al.
patent: 2003/0211684 (2003-11-01), Guo
patent: 2010/0087043 (2010-04-01), Cheng et al.
Baptiste Wilner Jean
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
Stark Jarrett J
LandOfFree
Method of forming semiconductor devices does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming semiconductor devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming semiconductor devices will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4223953