Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-09-04
2010-02-09
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07659744
ABSTRACT:
A testing circuit and method for a liquid crystal display device are presented. The circuit comprises: a substrate, a plurality of pixels formed on the substrate and having n sub-pixels, a plurality of signal paths, and a plurality of p shorting bars, The plurality of signal paths is formed on the substrate and connected to the sub-pixels correspondingly; the p shorting bars are formed on the substrate and respectively connected to (p×m+1)th, (p×m+2)th, (p×m+3)th . . . , (p×m+p)th numbered signal paths The method comprises: dividing the p shorting bars into n groups; and applying testing signals respectively to the shorting bars of every group. The method also comprises: dividing the p shorting bars into groups by odd-even sequence; and applying testing signals respectively to every group, so as to effectively increase the testing efficiency of array and cell tests in fabrication of the device.
REFERENCES:
patent: 6246074 (2001-06-01), Kim et al.
patent: 6392719 (2002-05-01), Kim
patent: 7388626 (2008-06-01), Wu et al.
Au Optronics Corporation
Rosenberg , Klein & Lee
Tang Minh N
LandOfFree
Pixel testing circuit and method for liquid crystal display... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Pixel testing circuit and method for liquid crystal display..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pixel testing circuit and method for liquid crystal display... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4216077