Test system, electronic device, and test apparatus

Details Test system, electronic device, and test apparatus Test system, electronic device, and test apparatus

2008-10-24

2010-12-07

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07847572

ABSTRACT:
Provided is a test system that tests a device under test, including a plurality of internal test circuits that are provided inside the device under test and that are used for testing an operation circuit of the device under test; a device control section that is electrically connected to the plurality of internal test circuits via a common bus and that controls the plurality of internal test circuits by supplying the common bus with an intra-device control signal corresponding to a received external signal; and a test apparatus that supplies the device control section with the external signal.

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“Search report of PCT counterpart application”, issued on Aug. 18, 2009, p. 1-p. 3.

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