Image analysis – Pattern recognition – Classification
Reexamination Certificate
2004-07-15
2010-02-23
Kim, Charles (Department: 2624)
Image analysis
Pattern recognition
Classification
Reexamination Certificate
active
07668377
ABSTRACT:
A method of obtaining a depth map from a single digital image of a three-dimensional scene containing geometric objects is provided that includes the identification in the image of at least one horizontal plane or one vertical plane of the three-dimensional scene and the assignment to every point of the image forming part of the identified plane, or to each one of the identified planes, of a depth level according to its distance from, respectively, a predetermined horizontal or vertical reference straight line of the image. In particular, the identification of at least one plane includes the identification in the image of at least two vanishing lines corresponding to two parallel lines in the plane and the assignment of a depth level made in accordance with the angular coefficients of the identified vanishing lines. Also included is a completely automatic method for obtaining a depth map from a single digital image of any three-dimensional scene.
REFERENCES:
patent: 4947347 (1990-08-01), Sato
patent: 2002/0031252 (2002-03-01), Rozin
patent: 1087626 (2001-03-01), None
Ardizzone Edoardo
Battiato Sebastiano
Curti Salvatore
La Cascia Marco
Scordato Emiliano
Jorgenson Lisa K.
Kim Charles
Lee John W
Seed IP Law Group PLLC
STMicroelectronics S.r.L.
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