Swept annode CT scanner

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Reexamination Certificate

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Reexamination Certificate

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07835488

ABSTRACT:
A computed tomography method includes rotating an electron beam along an anode (104) disposed about an examination region (112) for a plurality of sampling intervals in which x-ray projections are sampled. The electron beam is swept during each sampling interval to generate a plurality of successive focal spots at different focal spot locations during each sampling interval, wherein the focal spots generated in a given sampling interval include a sub-set of the focal spots generated in a previous sampling interval. The x-ray projections radiated from each of the plurality of focal spots is sampled during each sampling interval. The resulting data is reconstructed to generate volumetric image data.

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patent: 7023950 (2006-04-01), Annis
patent: 2004/0258196 (2004-12-01), Lounsberry
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patent: 2005/0100127 (2005-05-01), Zhao et al.
patent: 2006/0002514 (2006-01-01), Dunham
patent: 2006/0002515 (2006-01-01), Huber et al.
patent: 0269927 (1988-06-01), None
patent: 2255887 (1992-11-01), None
patent: 2004072679 (2004-08-01), None

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