Method of cleaning semiconductor surfaces

Cleaning and liquid contact with solids – Processes – Using solid work treating agents

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C134S001300, C438S906000

Reexamination Certificate

active

07655095

ABSTRACT:
Devices and methods of cleaning are described. The methods, and devices formed by the methods have a number of advantages. Embodiments are shown that include cleaning using a supercritical fluid. Advantages include a combination of both chemical and mechanical removal abilities from the supercritical fluid. Mechanical energy for cleaning is transmitted in a homogenous manner throughout a carrier fluid. The mechanical energy provided in methods shown can also be used with delicate surface features.

REFERENCES:
patent: 4817652 (1989-04-01), Liu
patent: 4944837 (1990-07-01), Nishikawa et al.
patent: 4962776 (1990-10-01), Liu et al.
patent: 5013366 (1991-05-01), Jackson et al.
patent: 5185296 (1993-02-01), Morita et al.
patent: 5304515 (1994-04-01), Morita et al.
patent: 5456759 (1995-10-01), Stanford, Jr. et al.
patent: 5900354 (1999-05-01), Batchelder
patent: 6071439 (2000-06-01), Bawa et al.
patent: 6149828 (2000-11-01), Vaartstra
patent: 6242165 (2001-06-01), Vaartstra
patent: 6306754 (2001-10-01), Agarwal
patent: 6558475 (2003-05-01), Jur et al.
patent: 6666986 (2003-12-01), Vaartstra
patent: 6800142 (2004-10-01), Tipton et al.
patent: 7064070 (2006-06-01), Mullee et al.
patent: 7303637 (2007-12-01), Farrar
patent: 2003/0116176 (2003-06-01), Rothman et al.
patent: 2003/0228738 (2003-12-01), Beaudoin
patent: 2004/0211440 (2004-10-01), Wang et al.
patent: 2005/0076935 (2005-04-01), Farrar
patent: 2006/0289033 (2006-12-01), Farrar
Wolf, S. , et al., “Chpt 15 “Wet Processing: Cleaning, Etching and Liftoff””,Silicon Processing for the VLSI Era, vol. 1—Process Technology, Lattice Press, Snset Beach, CA, (1986),514-520.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of cleaning semiconductor surfaces does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of cleaning semiconductor surfaces, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of cleaning semiconductor surfaces will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4211708

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.