Method for detecting tip position of probe, alignment...

Details Method for detecting tip position of probe, alignment... Method for detecting tip position of probe, alignment...

2008-03-12

2010-11-23

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

07839156

ABSTRACT:
An probe tip position detecting method detects tip positions of a plurality of probes by using a tip position detecting device including a sensor unit for detecting tips of the probes and a movable contact body belonging to the sensor unit, the method used in inspecting electrical characteristics of an object to be inspected by bringing the object supported on a movable mounting table into electrical contact with the probes. The method includes a first step for moving the tip position detecting device by using the mounting table to thereby bring the contact the object into contact with the tips of the probes; a second step for further moving the mounting table to thereby move the contact body toward the sensor unit without causing elastic deformation to the probes; and a third step of determining a movement starting position of the contact body as the tip positions of the probes.

REFERENCES:
patent: 5436571 (1995-07-01), Karasawa
patent: 5644245 (1997-07-01), Saitoh et al.
patent: 5773987 (1998-06-01), Montoya
patent: 6842023 (2005-01-01), Yoshida et al.
patent: 2004/0227535 (2004-11-01), Kobayashi et al.
patent: 2006/0097743 (2006-05-01), Komatsu
patent: 2006/0267613 (2006-11-01), Takahashi et al.
patent: 2007/0164770 (2007-07-01), Casler et al.
patent: 2008/0238455 (2008-10-01), Ishii

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