Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-05-05
2010-02-23
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07668673
ABSTRACT:
Input signals are electronically watermarked using an uneven or non-uniform sampling rate. The uneven or non-uniform sampling may be pseudo-random. The uneven or non-uniform sampling meets the Nyquist criterion so that aliasing and loss of content are avoided. The resulting sampling pattern in the sampled data is detectable by a comparison with the original source data.
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patent: 7051203 (2006-05-01), Smith
Bussan Matthew J.
International Business Machines - Corporation
Lau Tung S
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