Metalorganic chemical vapor deposition (MOCVD) growth of...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Including integrally formed optical element

Reexamination Certificate

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C438S046000, C257S102000, C257S103000, C257SE21001, C257SE33001

Reexamination Certificate

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07842527

ABSTRACT:
A method of device growth and p-contact processing that produces improved performance for non-polar III-nitride light emitting diodes and laser diodes. Key components using a low defect density substrate or template, thick quantum wells, a low temperature p-type III-nitride growth technique, and a transparent conducting oxide for the electrodes.

REFERENCES:
patent: 5793054 (1998-08-01), Nido
patent: 5994205 (1999-11-01), Yamamoto et al.
patent: 6316785 (2001-11-01), Nunoue et al.
patent: 6586819 (2003-07-01), Matsuoka
patent: 6648966 (2003-11-01), Maruska et al.
patent: 7091514 (2006-08-01), Craven et al.
patent: 7709284 (2010-05-01), Iza et al.
patent: 2002/0033521 (2002-03-01), Matsuoka
patent: 2002/0144645 (2002-10-01), Kim et al.
patent: 2002/0175341 (2002-11-01), Biwa et al.
patent: 2003/0024475 (2003-02-01), Anderson
patent: 2004/0106222 (2004-06-01), Steckl et al.
patent: 2005/0142391 (2005-06-01), Dmitriev et al.
patent: 2005/0161688 (2005-07-01), Biwa et al.
patent: 2005/0161697 (2005-07-01), Nakahata et al.
patent: 2005/0214992 (2005-09-01), Chakraborty et al.
patent: 2005/0258451 (2005-11-01), Saxler et al.
patent: 2006/0118798 (2006-06-01), Lee
patent: 2006/0270087 (2006-11-01), Imer et al.
patent: 2007/0114563 (2007-05-01), Paek et al.
patent: 2007/0128844 (2007-06-01), Craven et al.
patent: 2007/0218703 (2007-09-01), Kaeding et al.
Okamoto et al. (Dislocation-Free m-Plane InGaN/GaN Light-Emitting Diodes on m-plane GaN single Crystals), Japenese Journal of Applied Physics, vol. 45, No. 45, 2006, pp. L197-L1199.
Chakraborty et al. (Demonstration of Nonpolar m-Plane InGaN/GaN Light-Emitting Diodes on Free-Standing m-Plane GaN Substrates), Japenese Journal of Applied Physics, vol. 44, No. 5, 2005, pp. L173-L175.
International Search Report for PCT Application No. PCT/US2007/25249 filed Dec. 11, 2007.
Shao, Y-P. et al., “Electrical Characterization of Semipolar Gallium Nitride Thin Films,” NNIN REU Research Accomplishments, Aug. 2005, pp. 132-133.
Chakraborty, A. et al., “Demonstration of Non-Polar m-Plane InGaN/GaN Light-Emitting Diodes on Free-Standing m-Plane GaN Substrates,” Jpn. J. Appl. Phys., 2005, pp. L173-L175, vol. 44, No. 5.
Masui, H. et al., “Polarized Light Emission From Non-Polar InGaN Light-Emitting Diodes Grown on a Bulk m-Plane GaN Substrate,” Jpn. J. Appl. Phys., 2005, pp. L1329-L1332, vol. 44, No. 43.
Okamoto, K. et al., “Dislocation-Free m-Plane InGaN/GaN Light-Emitting Diodes on m-Plane GaN Single Crystals,” Jpn. J. Appl. Phys., 2006, pp. L1197-L1199, vol. 45, No. 45.
Takeuchi, T. et al., “Quantum-Confined Stark Effect due to Piezoelectric Fields in GaInN Strained Quantum Wells,” Jpn. J. Appl. Phys., 1997, pp. L382-L385, vol. 36, Part 2, No. 4A.
H. M. Ng, “Molecular-beam epitaxy of GaN/AlxGa1-xN multiple quantum wells on R-plane (1012) sapphire substrates”, Applied Physics Letters, vol. 80, No. 23, June 10, 2002, pp. 4369-4371.

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