Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device
Reexamination Certificate
2007-11-21
2010-12-07
Tran, Thien F (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
C257S189000, C257S192000, C257S194000, C257SE29246
Reexamination Certificate
active
07847319
ABSTRACT:
A semiconductor device has a Group III nitride semiconductor layer and a gate electrode formed on the Group III nitride semiconductor layer. The gate electrode contains an adhesion enhancing element. A thermally oxidized insulating film is interposed between the Group III nitride semiconductor layer and the gate electrode.
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Hirose Yutaka
Ikeda Yoshito
Inoue Kaoru
McDermott Will & Emery LLP
Panasonic Corporation
Tran Thien F
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