Stain inspection method and apparatus

Details Stain inspection method and apparatus Stain inspection method and apparatus

2006-02-09

2010-02-23

Tabatabai, Abolfazl (Department: 2624)

Image analysis

Applications

Document or print quality inspection

C356S073100

Reexamination Certificate

active

07668344

ABSTRACT:
(A) Luminance data is prepared. (B) A group of first order differential values is obtained from luminance values of said luminance data along a first direction, a group of second order differential values is obtained from the group of first order differential values, and first data is output in accordance with the group of second order differential values. There is provided a stain inspection method having high inspection correctness.

REFERENCES:
patent: 7133565 (2006-11-01), Toda et al.
patent: 7239740 (2007-07-01), Fujieda
patent: 7561752 (2009-07-01), Monobe et al.
patent: 9-329527 (1997-12-01), None
patent: 10-206344 (1998-08-01), None
patent: 11-66311 (1999-03-01), None
patent: 2003-329597 (2003-11-01), None

Affiliated with

Also associated with

Rating

Stain inspection method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Stain inspection method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Stain inspection method and apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4182757