Semiconductor device for performing mount test in response...

Details Semiconductor device for performing mount test in response... Semiconductor device for performing mount test in response...

2007-12-27

2010-12-21

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07855570

ABSTRACT:
A semiconductor device includes: a plurality of pins for receiving a plurality of external mount test signals; and a signal generating unit for generating a plurality of internal test mode signals in response the external mount test signals, wherein the semiconductor device enters into a mount test mode in response to the internal test mode signals for evaluating an operation of the semiconductor device mounted on an actual application device.

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