Detecting defects by three-way die-to-die comparison with...

Details Detecting defects by three-way die-to-die comparison with... Detecting defects by three-way die-to-die comparison with...

2006-02-28

2010-02-02

Mehta, Bhavesh M (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S149000, C438S016000, C356S237500

Reexamination Certificate

active

07657077

ABSTRACT:
A method of determining defects in a plurality of images having essentially the same image contents is disclosed. A comparison operation is carried out once three fully comparable images having essentially the same image contents are present in the intermediate memory. The stored individual images are accessed randomly. A paired comparison operation between the three difference images is carried out.

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