Non-volatile memory device and method of fabricating the same

Static information storage and retrieval – Floating gate

Reexamination Certificate

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C365S185060, C365S185260, C365S185330, C257S315000

Reexamination Certificate

active

07663912

ABSTRACT:
A non-volatile memory device and a method of fabricating the same are disclosed. The method includes the steps of: providing a semiconductor substrate having isolation layers in an isolation region, a tunnel insulating layer formed between the isolation layers, and first electron charge layers formed between the isolation layers, wherein the isolation layers comprise projections extending higher than the semiconductor substrate; etching the first electron charge layers, thereby reducing the thickness of the first electron charge layers and exposing sidewalls of the isolation layers; performing a first etch process to reduce the width of the projections; forming second electron charge layers between the projections on the first electron charge layers; and performing a second etch process to remove the projections between the second electron charge layers.

REFERENCES:
patent: 2001/0001720 (2001-05-01), Clampitt et al.
patent: 2001/0020718 (2001-09-01), Takahashi et al.
patent: 2002/0028541 (2002-03-01), Lee et al.
patent: 2002/0038877 (2002-04-01), Ichige et al.
patent: 2003/0168693 (2003-09-01), Yi et al.
patent: 2004/0016956 (2004-01-01), Choi et al.
patent: 2004/0075134 (2004-04-01), Lin et al.
patent: 2005/0006695 (2005-01-01), Lee et al.
patent: 2003-197789 (2003-07-01), None
patent: 10-2005-0002244 (2005-01-01), None
patent: 10-2005-0075631 (2005-07-01), None
patent: 10-2006-0000797 (2006-01-01), None
patent: 10-2006-0067058 (2006-06-01), None
patent: 10-2006-075442 (2006-07-01), None
patent: 10-2006-0099157 (2006-09-01), None

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