Nonvolatile semiconductor memory having a floating gate...

Static information storage and retrieval – Floating gate

Reexamination Certificate

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C365S185050, C365S185180

Reexamination Certificate

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07733694

ABSTRACT:
According to an aspect of the invention, a nonvolatile semiconductor memory comprises: a semiconductor substrate; a trench formed in the semiconductor substrate; a first insulating film being formed on a wall surface of the trench; a floating gate electrode formed on the first insulating film inside the trench; a source region formed in the semiconductor substrate; a drain region formed in the semiconductor substrate; a channel region formed between the source region and the drain region in the semiconductor substrate, a second insulating film formed on a surface of the semiconductor substrate; and a control gate electrode formed on the channel region and a surface of the second insulating film. The channel region is adjacent to the trench. A storage state of the nonvolatile semiconductor memory is formed by injecting or drawing charge into or from the floating gate electrode when a tunnel current flows through the first insulating film.

REFERENCES:
patent: 5576567 (1996-11-01), Mori
patent: 6271088 (2001-08-01), Liu et al.
patent: 6317360 (2001-11-01), Kanamori
patent: 6657251 (2003-12-01), Meguro
patent: 6724025 (2004-04-01), Takashima et al.
patent: 2005/0265076 (2005-12-01), Forbes
patent: 2-10597 (1990-01-01), None
patent: 4-118973 (1992-04-01), None

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