Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to conductive state
Reexamination Certificate
2001-07-30
2010-10-19
Toledo, Fernando L (Department: 2895)
Semiconductor device manufacturing: process
Making device array and selectively interconnecting
Using structure alterable to conductive state
C365S051000
Reexamination Certificate
active
07816188
ABSTRACT:
A high density plasma oxidation process is provided in which a dielectric film is formed having a predetermined thickness. Plasma oxidation conditions are provided such that the growth rate of the dielectric film is limited in order to produce dielectric layer having a precise thickness and uniformity. The high density plasma oxidation process can be used to fabricate gate oxide layers, passivation layers and antifuse layers in semiconductor devices such as semiconductor memory devices and multi-level memory arrays.
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Cleeves James M.
Knall N. Johan
Vyvoda Michael A.
Brinks Hofer Gilson & Lione
SanDisk 3D LLC
Toledo Fernando L
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