Process for fabricating a dielectric film using plasma...

Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to conductive state

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S051000

Reexamination Certificate

active

07816188

ABSTRACT:
A high density plasma oxidation process is provided in which a dielectric film is formed having a predetermined thickness. Plasma oxidation conditions are provided such that the growth rate of the dielectric film is limited in order to produce dielectric layer having a precise thickness and uniformity. The high density plasma oxidation process can be used to fabricate gate oxide layers, passivation layers and antifuse layers in semiconductor devices such as semiconductor memory devices and multi-level memory arrays.

REFERENCES:
patent: 4581248 (1986-04-01), Roche
patent: 4684541 (1987-08-01), Franciosi
patent: 5847441 (1998-12-01), Cutter et al.
patent: 5869149 (1999-02-01), Denison et al.
patent: 5913138 (1999-06-01), Yamaoka et al.
patent: 5930650 (1999-07-01), Chung et al.
patent: 5962079 (1999-10-01), Koberstein et al.
patent: 6170428 (2001-01-01), Redeker et al.
patent: 6185122 (2001-02-01), Johnson et al.
patent: 6200837 (2001-03-01), Ihn et al.
patent: 6296780 (2001-10-01), Yan et al.
patent: 6335288 (2002-01-01), Kwan et al.
patent: 6399520 (2002-06-01), Kawakami et al.
patent: 6500710 (2002-12-01), Nakagawa
patent: 6509283 (2003-01-01), Thomas
patent: 6541312 (2003-04-01), Cleeves et al.
patent: 2002/0137266 (2002-09-01), Moon et al.
patent: 2003/0211705 (2003-11-01), Tong et al.
Article, “Plasma-Assisted Oxidation, Anodization, And Nitridation of Silicon,” D.W. Hess,IBM® Journal of Research&Development, vol. 43, No. 1/2—Plasma processing, 1999, [Internet web pages].
Article, “3D-ROM—A First Practical Step Towards 3D-IC”, G. Zhang, Ph.D.,Cahners Semiconductor International, Jul. 2000 [Internet web pages].
Article, “Improving IC Yield with Protective Ceramics”, G. Zhang, Ph.D.,IBM® Journal of Research&Development, Jun. 2000, pp. 217-220.
Article, “High-Density Plasma Chemical Vapor Deposition Of Silicon-Based Dielectric Films for Integrated Circuits,”IBM® Journal of Research&Development, 1999, S.V. Nguyen, [Internet web pages].
Article, “Highly Reliable Ultrathin Silicon Oxide Film Formation at Low Temperature by Oxygen Radical Generated in High-Density Krypton Plasma,” Sekine et al.,IEEE Transactions on Electron Devices, vol. 48, No. 8, Aug. 2001.
Article, “A Novel High-Density Low-Cost Diode Programmable Read Only Memory,” de Graaf et al., 1996 IEEE,IEDM96-189-192.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for fabricating a dielectric film using plasma... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for fabricating a dielectric film using plasma..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for fabricating a dielectric film using plasma... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4161449

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.