Registers – Records – Conductive
Reexamination Certificate
2005-09-05
2010-02-09
Le, Thien M. (Department: 2887)
Registers
Records
Conductive
C235S380000, C235S451000, C257S050000, C257S173000, C257S529000, C257S530000, C257S665000, C257S910000, C327S524000, C327S525000
Reexamination Certificate
active
07658333
ABSTRACT:
A semiconductor device used as an ID chip is provided, of which operation is terminated when its role is finished or expires. According to the invention, an antenna circuit, a voltage detecting circuit, a current amplifier circuit, a signal processing circuit, and a fuse are provided over an insulating substrate. When large power is applied to the antenna circuit, a voltage is detected by voltage detecting circuit and a corresponding current is amplified by the current amplifier circuit, thereby the fuse is melted down. Also, when an anti-fuse is used, the anti-fuse can short an insulating film by applying an excessive voltage. In this manner, the semiconductor device has a function for making it invalid by stopping operation of the signal processing circuit when the role of the device is finished or expires.
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Koyama Jun
Yamazaki Shunpei
Le Thien M.
Robinson Eric J.
Robinson Intellectual Property Law Office P.C.
Semiconductor Energy Laboratory Co,. Ltd.
Vo Tuyen K
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