Method for calibrating semiconductor device tester

Details Method for calibrating semiconductor device tester Method for calibrating semiconductor device tester

2007-08-06

2010-02-02

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C702S089000, C714S742000

Reexamination Certificate

active

07656178

ABSTRACT:
A method for calibrating a semiconductor device tester is disclosed. In accordance with method of the present invention, a timing is calibrated using a programmable delay device and calibration boards so as to remove a timing difference between channels and compensate a linearity of the programmable delay device for an adjustment of a timing by building and using a database of the round trip delay actually generated during the test.

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